{"id":95,"date":"2021-04-23T13:41:48","date_gmt":"2021-04-23T10:41:48","guid":{"rendered":"https:\/\/labsensors.org\/?page_id=95"},"modified":"2021-05-17T11:48:31","modified_gmt":"2021-05-17T08:48:31","slug":"ntegra-prima","status":"publish","type":"page","link":"https:\/\/labsensors.org\/en\/equipment\/ntegra-prima\/","title":{"rendered":"Scanning probe microscope Ntegra Prima"},"content":{"rendered":"

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Allows you to investigate the morphology of the sample by atomic force and tunneling microscopy. The scanning head of the microscope is located in a vacuum chamber, which provides research in medium and high vacuum conditions. The presence of active and passive vibration protection allows achieving high measurement accuracy. The presence of a specialized measuring head makes it possible to measure the morphology of objects in a liquid medium. Allows to implement the following measurement methods:<\/p>\n

Atomic force microscopy (contact, non-contact and semi-contact modes): study of the surface morphology of the sample.<\/p>\n

Magnetic force microscopy: study of the distribution of the magnetic moment over the surface of the sample.<\/p>\n

Kelvin probe method: measuring the distribution of the surface potential (contact potential difference) over the surface of the sample.<\/p>\n

Piezoresponse force microscopy: The PFM technique is based on the inverse piezoelectric effect, which is a linear relationship between the electric field and mechanical deformation.<\/p>\n

Scanning Tunnel Microscopy: Study the morphology of conductive samples. Allows you to get an image with atomic resolution. It also allows one to obtain tunneling current-voltage characteristics of the samples.<\/p>\n

Examples of images obtained during the study:<\/span><\/span><\/p>\n

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Images of nickel arachinate nanoclusters (image size 1×1 \u03bcm), formed under Langmuir monolayers of arachidic acid, obtained in the semi-contact mode of displaying the surface topology and phase contrast<\/span><\/span><\/p>\n","protected":false},"excerpt":{"rendered":"

                                                    Allows you to investigate the morphology of the sample by atomic force and tunneling microscopy. The scanning head of the microscope is located in a vacuum chamber, which provides […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":18,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-95","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/95","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/comments?post=95"}],"version-history":[{"count":2,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/95\/revisions"}],"predecessor-version":[{"id":360,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/95\/revisions\/360"}],"up":[{"embeddable":true,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/18"}],"wp:attachment":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/media?parent=95"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}