{"id":211,"date":"2021-04-30T12:49:55","date_gmt":"2021-04-30T09:49:55","guid":{"rendered":"https:\/\/labsensors.org\/?page_id=211"},"modified":"2021-05-17T11:28:08","modified_gmt":"2021-05-17T08:28:08","slug":"4339b","status":"publish","type":"page","link":"https:\/\/labsensors.org\/en\/equipment\/4339b\/","title":{"rendered":"Agilent 4339B High Resistance Meters"},"content":{"rendered":"<h4>Agilent 4339B High Resistance Meters<\/h4>\n<h4><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-212\" src=\"https:\/\/labsensors.org\/wp-content\/uploads\/2021\/04\/izobrazhenie_2021-04-30_124923.png\" alt=\"\" width=\"493\" height=\"231\" srcset=\"https:\/\/labsensors.org\/wp-content\/uploads\/2021\/04\/izobrazhenie_2021-04-30_124923.png 493w, https:\/\/labsensors.org\/wp-content\/uploads\/2021\/04\/izobrazhenie_2021-04-30_124923-300x141.png 300w\" sizes=\"auto, (max-width: 493px) 100vw, 493px\" \/><\/h4>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>For precision bench-top applications, the 1-channel 4339B is the premier solution for accurate high resistance and low current tests. For high resistance testing in manufacturing environments, the 4349B offers simultaneous 4-channel high resistance measurements for increased test throughput.<\/p>\n<table style=\"height: 252px;\" width=\"905\">\n<tbody>\n<tr>\n<td width=\"213\"><strong>High quality results<\/strong><br \/>\n\u2022 High confidence testing with<br \/>\ncontact check function<br \/>\n\u2022 Remove parasitics with error<br \/>\ncorrection<br \/>\n\u2022 Consistent data with 0.6% basic<br \/>\naccuracy<br \/>\n\u2022 Compensation for handler contact<br \/>\nchattering with trigger delay<\/td>\n<td width=\"213\"><strong>Versatile measurements<\/strong><br \/>\n\u2022 Select from four test parameters<br \/>\n\u2022 Use a variety of test fixtures<br \/>\nand accessories<br \/>\n\u2022 Perform a charge-measuredischarge sequence with the test<br \/>\nsequence program function<br \/>\n\u2022 Save and recall up to ten<br \/>\nmeasurement setups<\/td>\n<td width=\"213\"><strong>High test throughput<\/strong><br \/>\n\u2022 9.5 ms measurements<br \/>\n\u2022 4-channels for multiple DUTs<br \/>\n\u2022 4-channel simultaneous testing<br \/>\n\u2022 Fast contact checking: 2 ms\/<br \/>\nmeasurement<br \/>\n\u2022 GPIB and handler interfaces<br \/>\n\u2022 Ideal for high volume capacitor<br \/>\ntesting<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Key parameters and specifications<\/strong><\/p>\n<p>Test channels\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a01<br \/>\nTest voltage(Vdc)\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 0.1 to 1000<br \/>\nMeasurement parameters\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 R, I, pv, ps<br \/>\nMeasurement range (\u2126)\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a010^3 to 1.6&#215;10^16<br \/>\nBasic accuracy\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a00.6%<br \/>\nDisplay resolution\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 3 \/ 4 \/ 5 digits<br \/>\nMeasurement time\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a010 ms\/30 ms\/390 ms<\/p>\n<table style=\"height: 334px;\" width=\"908\">\n<tbody>\n<tr>\n<td style=\"text-align: center;\" width=\"159\">\n<p style=\"text-align: left;\"><strong>High quality measurements<\/strong><br \/>\n<strong>with flexible hardware<\/strong><br \/>\n\u2022 Resolve data to 5 digits<br \/>\n(3, 4, or 5 digits selectable)<br \/>\n\u2022 Make precise measurements<br \/>\nwith 0.6% basic accuracy<br \/>\n\u2022 Verify DUT performance at<br \/>\nthe exact voltage rating<br \/>\n\u2022 Reliable and safety measurements<br \/>\nwith Agilent 16339A component<br \/>\ntest fixture<\/p>\n<\/td>\n<td style=\"text-align: left;\" width=\"160\"><strong>4339B solutions for high<\/strong><br \/>\n<strong>voltage material testing<\/strong><br \/>\n\u2022 Resistivity mathematics built-in:<br \/>\nsurface and volume<br \/>\n\u2022 Agilent 16008B resistivity cell for<br \/>\nsolid samples<br \/>\n\u2022 Easy measurements with test<br \/>\nsequence program function<br \/>\n(controls charge-measuredischarge sequence)<br \/>\n\u2022 Customize your fixture cabling<br \/>\nwith the Agilent 16117C test<\/td>\n<td width=\"160\">\n<p style=\"text-align: left;\"><strong>System features you need to<\/strong><br \/>\n<strong>be successful<\/strong><br \/>\n\u2022 Maximize accuracy with<br \/>\nerror correction<br \/>\n\u2022 Test capacitor contact failure<br \/>\nwith contact check function<br \/>\n\u2022 Automate testing with GPIB<br \/>\ninterface<br \/>\n\u2022 Reduce ground-loops with<br \/>\nisolated handler interface<br \/>\n\u2022 Pass\/Fail testing with comparator<br \/>\nfunction (high\/in\/low)<\/p>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p>Agilent 4339B High Resistance Meters &nbsp; &nbsp; For precision bench-top applications, the 1-channel 4339B is the premier solution for accurate high resistance and low current tests. For high resistance testing in manufacturing environments, the 4349B offers simultaneous 4-channel high resistance measurements for increased test throughput. High quality results \u2022 High confidence testing with contact check [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":18,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-211","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/211","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/comments?post=211"}],"version-history":[{"count":2,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/211\/revisions"}],"predecessor-version":[{"id":350,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/211\/revisions\/350"}],"up":[{"embeddable":true,"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/pages\/18"}],"wp:attachment":[{"href":"https:\/\/labsensors.org\/en\/wp-json\/wp\/v2\/media?parent=211"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}